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Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 8 PART A, 1998, Pages

Characterization and control of domain structure in SrBi2Ta2O9 thin films by scanning force microscopy

(2) Gruverman, Alexei a Ikeda, Yuji a

a SONY CORPORATION (Japan)

Author keywords

Domain; Layered ferroelectrics; Scanning force microscopy; Thin films

Indexed keywords

FERROELECTRIC MATERIALS; MICROSCOPIC EXAMINATION; STRONTIUM COMPOUNDS; THIN FILMS;

SCANNING FORCE MICROSCOPY (SFM);

DIELECTRIC FILMS;

EID: 0032136721 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.37.l939 Document Type: Article

Times cited : (52)

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