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Volumn 85, Issue 1, 2000, Pages 190-193
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Measurement of internal stresses via the polarization in epitaxial ferroelectric films
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFERENTIAL EQUATIONS;
ELASTICITY;
ELECTRODES;
EPITAXIAL GROWTH;
FREE ENERGY;
PERMITTIVITY;
POLARIZATION;
SUBSTRATES;
THIN FILMS;
DIELECTRIC SUSCEPTIBILITY;
ELASTIC STRAIN TENSOR;
FERROELECTRIC FILMS;
INTERNAL STRESSES;
FERROELECTRIC DEVICES;
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EID: 0034227699
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.85.190 Document Type: Article |
Times cited : (118)
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References (13)
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