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Volumn 85, Issue 1, 2000, Pages 190-193

Measurement of internal stresses via the polarization in epitaxial ferroelectric films

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL EQUATIONS; ELASTICITY; ELECTRODES; EPITAXIAL GROWTH; FREE ENERGY; PERMITTIVITY; POLARIZATION; SUBSTRATES; THIN FILMS;

EID: 0034227699     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.190     Document Type: Article
Times cited : (118)

References (13)
  • 3
    • 0008731577 scopus 로고    scopus 로고
    • A. L. Roytburd, J. Appl. Phys. 83, 228 (1998); 83, 239 (1998).
    • (1998) J. Appl. Phys. , vol.83 , pp. 239


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.