Scaling of ferroelectric and piezoelectric properties in Pt/SrBi2Ta2O9/Pt thin films

Applied Physics Letters

Volumn 75, Issue 24, 1999, Pages 3874-3876

  Ganpule, C S ^a   Stanishevsky, A ^a   Aggarwal, S ^a   Melngailis, J ^a   Williams, E ^a   Ramesh, R ^a   Joshi, V ^b   Paz De Araujo, Carlos ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b Symetrix Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001453101     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125485     Document Type: Article

References (20)

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