Kelvin probe force microscopy on surfaces: investigation of the surface potential of self-assembled monolayers on gold

Langmuir

Volumn 15, Issue 23, 1999, Pages 8184-8188

  Lu J ^a   Delamarche, E ^b   Eng, L ^a   Bennewitz, R ^a   Meyer, E ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS; GOLD; MATHEMATICAL MODELS; MOLECULES; MONOLAYERS; SURFACE TOPOGRAPHY;

ALKANETHIOLS; CONTACT POTENTIAL DIFFERENCE; KELVIN PROBE FORCE MICROSCOPY; SELF ASSEMBLED MONOLAYERS;

MICROSCOPIC EXAMINATION;

EID: 0033314738     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9904861     Document Type: Article

References (20)

1. McClelland, G. M.; Erlandsson, R.; Chiang, S. Rev. Prog. Quant. Nondestr. Eval. 1987, 6B, 1307.
2. Martin Y.; Williams C. C.; Wickramasinghe, H. K. J. Appl. Phys. 1987, 61, 4723.
3. Weaver, J. M. R.; Abraham, D. W. J. Vac. Sci. Technol. B 1991, 9, 1561.
4. Nonnenmacher, M.; O'Boyle, M. P.; Wickramasinghe, H. K. Appl. Phys. Lett. 1991, 58, 2921.
5. Lü, J.; Guggisberg, M.; Lüthi, R.; Kubon, M.; Scandella, L.; Gerber, Ch.; Meyer, E.; Güntherodt, H. J. Appl. Phys. A 1998, 66, 273.
6. Kikukawa, A.; Hosaka, S.; Imura, R. Rev. Sci. Instrum. 1996, 67, 1463.
7. Jacobs, H. O.; Knapp, H. F.; Müller, S.; Stemmer, A. Ultramicroscopy 1997, 69, 39.
8. Muralt, P.; Pohl, D. W. Appl. Phys. Lett. 1986, 48, 514.
9. Pelz, J. P.; Koch, R. H. Rev. Sci. Instrum. 1989, 60, 301.
10. Kirtley, J. R.; Washburn, S.; Brady, M. J. Appl. Phys. Lett. 1988, 60, 1546.
11. Fujihira, M.; Kawate, H.; Yasutake, M. Chem. Lett. 1982, 2223.
12. Kumar, A.; Biebuyck, H. A.; Whitesides, G. M. Langmuir 1994, 10, 1498.
13. Xia, Y.; Whitesides, G. M. Angew. Chem., Int. Ed. Engl. 1998, 37, 550.
14. Delamarche, E.; Schmid, H.; Michel, B.; Biebuyck, H. A. Adv. Mater. 1997, 9, 741.
15. Libioulle, L.; Bietsch, A.; Schmid, H.; Michel, B.; Delamarche, E. Langmuir 1999, 15, 300.
16. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321.
17. Hao, H. W.; Baro, A. M.; Saenz, J. J. Vac. Sci. Technol., B 1991, 9, 1323.
18. Nonnenmacher, M.; Wickramasinghe, H. K. Ultramicroscopy 1992, 42, 351.
19. Delamarche, E.; Michel, B.; Biebuyck, H. A.; Gerber, Ch. Adv. Mater. 1996, 8, 719.
20. Evans, S. D.; Ulman, A. Chem. Phys. Lett. 1990, 770, 462.