Properties of ferroelectric films at small dimensions

Annual Review of Materials Science

Volumn 30, Issue , 2000, Pages 263-298

  Shaw, T M ^a   Trolier McKinstry, S ^b   McIntyre, P C ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c Stanford University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DEFECTS; ELECTRODES; FERROELECTRIC MATERIALS; INTERFACES (MATERIALS); LEAKAGE CURRENTS; MICROSTRUCTURE; PIEZOELECTRICITY; POLARIZATION; THIN FILMS;

FERROELECTRIC FILMS; SIZE EFFECT;

DIELECTRIC FILMS;

EID: 0033693584     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.matsci.30.1.263     Document Type: Article

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