Investigation of bulk and interfacial properties of Ba0.5Sr0.5TiO3 thin film capacitors

Applied Physics Letters

Volumn 72, Issue 22, 1998, Pages 2820-2822

  Zafar, Sufi ^a   Jones, Robert E ^a   Chu, Peir ^a   White, Bruce ^a   Jiang, Bo ^a   Taylor, Deborah ^a   Zurcher, Peter ^a   Gillepsie, Sherry ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21544465073     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121495     Document Type: Article

References (5)

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3. A. I. Kingon, S. K. Streiffer, C. Basceri, and S. R. Summerfelt, Materials Research Society Bulletin, July 1996, p. 46.
4. Y. Kato, H. Yabuta, S. Sone, H. Yamaguchi, T. IIzuka, S. Yamamichi, P-Y Lesaicherre, S. Nishimoto, and M. Yoshida, Materials Research Society Symposium Proceedings Vol. 433, edited by S. Desu, R. Ramesh, B. Tuttle, and R. E. Jones, I. K. Yoo (MRS Press, Pittsburgh, 1996), p. 3.
5. T. Horikawa, T. Makita, T. Kuroiwa, and N. Mikami, Jpn. J. Appl. Phys., Part 1 34, 5478 (1996).