The capacitance of Pt/Pb0.65La0.28Ti0.96O3/Pt structures

Applied Physics Letters

Volumn 68, Issue 21, 1996, Pages 3043-3045

  Shaw, T M ^a   Laibowitz, R B ^a   Beach, D ^b   Duncombe, P R ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 6744249632     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115571     Document Type: Article

References (13)

1. S. K. Dey and J. J. Lee, IEEE Trans. Electron. Devices INS 39, 1607 (1992).
2. G. R. Fox and S. B. Krupanidhi, J. Mater. Res. AIP 8, 2203 (1993).
3. Y. Shimizu, K. R. Udayakumar, and L. E. Cross, J. Am. Ceram. Soc. INS 74, 3023 (1991).
4. D. B. Beach, R. B. Laibowitz; T. M. Shaw, A. Grill, and W. F. Kane, Integ. Ferroelectrics 7, 449 (1994).
5. L. F. Francis and D. A. Payne, J. Am. Ceram. Soc. INS 74, 3000 (1991).
6. J. J. Lee, P. Alluri, and S. K. Dey, Appl. Phys. Lett. AIP 65, 2027 (1994).
7. S. M. Sze, D. J. Coleman, and A. Loya, Solid State Electron. INS 14, 1209 (1971).
8. K. D. Budd, S. K. Dey, and D. A. Payne, Brit. Ceram. Soc. 36, 107 (1985).
9. G. H. Haertling and C. E. Land, J. Am. Ceram. Soc. INS 54, 1 (1971).
10. G. Teowee and D. R. Uhlmann, Mater. Res. Soc. Symp. Proc. INS 310, 415 (1993).
11. E. H. Rhoderick and R. H. Williams, Metal-Semiconductor Contacts (Clarendon, Oxford, 1988).
12. M. V. Raymond and D. M. Smyth, Proceedings of NATO Workshop on Science and Technology of Ceramic Thin Films, edited by X. Auciello and R. Wasser (Kluwer, Dordrecht, 1994).
13. R. Waser and M. Klee, Integ. Ferroelectrics 2, 23 (1992).