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Volumn 85, Issue 1, 1999, Pages 287-295

Depletion layer thickness and Schottky type carrier injection at the interface between Pt electrodes and (Ba,Sr)TiO3 thin films

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Indexed keywords


EID: 0001492277     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369443     Document Type: Article
Times cited : (137)

References (30)
  • 19
    • 0012537372 scopus 로고
    • The nature of electronic conduction in thin insulating layers
    • in edited by G. Barbottin and A. Vapaille Elsevier Science, North-Holland
    • P. Hesto, "The nature of electronic conduction in thin insulating layers" in Instabilities in Silicon Devices: Silicon Passivation and Related Instabilities, edited by G. Barbottin and A. Vapaille (Elsevier Science, North-Holland, 1986), p. 306.
    • (1986) Instabilities in Silicon Devices: Silicon Passivation and Related Instabilities , pp. 306
    • Hesto, P.1
  • 20
    • 0003999843 scopus 로고
    • in edited by J. R. Roberts and R. Popper Academic, London
    • B. Jaffe, W. R. Cook, and H. Jaffe, in Piezoelectric Ceramics, edited by J. R. Roberts and R. Popper (Academic, London, 1971).
    • (1971) Piezoelectric Ceramics
    • Jaffe, B.1    Cook, W.R.2    Jaffe, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.