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Volumn 21, Issue 6, 1996, Pages 55-58

Process integration for nonvolatile ferroelectric memory fabrication

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DEPOSITION; ETCHING; FABRICATION; FERROELECTRIC MATERIALS; HYSTERESIS; NONVOLATILE STORAGE; PASSIVATION; PHOTORESISTS; PROCESS CONTROL; TRANSISTORS;

EID: 0030164357     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400046091     Document Type: Article
Times cited : (48)

References (25)
  • 7
    • 0029232269 scopus 로고
    • Ferroelectric Thin Films IV, edited by B.A. Tuttle, S.B. Desu, R. Ramesh, and T. Shiosaki Pittsburgh
    • I. Chung, J.K. Lee, W.I. Lee, C.W. Chung, and S.B. Desu, in Ferroelectric Thin Films IV, edited by B.A. Tuttle, S.B. Desu, R. Ramesh, and T. Shiosaki (Mater. Res. Soc. Symp. Proc. 361, Pittsburgh, 1995) p. 249.
    • (1995) Mater. Res. Soc. Symp. Proc. , vol.361 , pp. 249
    • Chung, I.1    Lee, J.K.2    Lee, W.I.3    Chung, C.W.4    Desu, S.B.5
  • 13
    • 0029232267 scopus 로고
    • Ferroelectric Thin Films IV, edited by B.A. Tuttle, S.B. Desu, R. Ramesh, and T. Shiosaki Pittsburgh
    • J. Lee, R. Ramesh, and V.G. Keramidas, in Ferroelectric Thin Films IV, edited by B.A. Tuttle, S.B. Desu, R. Ramesh, and T. Shiosaki (Mater. Res. Soc. Symp. Proc. 361, Pittsburgh, 1995) p. 67.
    • (1995) Mater. Res. Soc. Symp. Proc. , vol.361 , pp. 67
    • Lee, J.1    Ramesh, R.2    Keramidas, V.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.