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Applied Physics Letters

Volumn 72, Issue 4, 1998, Pages 498-500

Dielectric relaxation of Ba0.7Sr0.3TiO3 thin films from 1 mHz to 20 GHz

(8) Baniecki, J D a,b Laibowitz, R B b Shaw, T M b Duncombe, P R b Neumayer, D A b Kotecki, D E c Shen, H d Ma, Q Y a

a Columbia University ^* (United States)

b IBM T J WATSON RESEARCH CENTER (United States)

c IBM MICROELECTRONICS (United States)

d Siemens Microelectronics Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000897749 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.120796 Document Type: Article

Times cited : (139)

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