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Volumn 21, Issue 1 -4 pt 1, 1998, Pages 27-40
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Electrical characterization of ferroelectric, paraelectric, and superparaelectric thin films
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
DYNAMIC RANDOM ACCESS STORAGE;
ELECTRIC POTENTIAL;
ELECTRODES;
EQUIVALENT CIRCUITS;
FERROELECTRIC DEVICES;
GRAIN SIZE AND SHAPE;
PERMITTIVITY;
POLARIZATION;
SEMICONDUCTOR DEVICE MODELS;
THIN FILM DEVICES;
CAPACITANCE-VOLTAGE CHARACTERISTICS;
SUPERPARAELECTRIC THIN FILMS;
CAPACITORS;
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EID: 0032321099
PISSN: 10584587
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1080/10584589808202048 Document Type: Article |
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Times cited : (27)
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References (20)
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