Nanoscale imaging of domain dynamics and retention in ferroelectric thin films

Applied Physics Letters

Volumn 71, Issue 24, 1997, Pages 3492-3494

  Gruverman, A ^a   Tokumoto, H ^a   Prakash, A S ^b   Aggarwal, S ^b   Yang, B ^b   Wuttig, M ^b   Ramesh, R ^b   Auciello, O ^c   Venkatesan, T ^b  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b UNIVERSITY OF MARYLAND   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC MATERIALS; IMAGING TECHNIQUES; POLARIZATION; POLYCRYSTALLINE MATERIALS;

POLARIZATION REVERSAL; RANDOM WALK PROCESS;

DIELECTRIC FILMS;

EID: 0031344718     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120369     Document Type: Article

References (13)

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