Curie - Von Schweidler behaviour observed in ferroelectric thin films and comparison to superparaelectric thin film materials

Integrated Ferroelectrics

Volumn 22, Issue 1-4, 1998, Pages 109-121

  Schumacher, M ^a   Waser, R ^b  

^a AIXTRON AG   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

BST; CSD; Dielectric relaxation; Ferroelectric relaxation; Hopping currents; MOCVD; PZT

Indexed keywords

BARIUM COMPOUNDS; DIELECTRIC RELAXATION; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; MATHEMATICAL MODELS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; THIN FILMS;

BARIUM STRONTIUM TANTALATE; CHEMICAL SOLUTION DEPOSITION (CSD); CURIE-VON SCHWEIDLER RELAXATION; LEAD ZIRCONATE TITANATE;

DIELECTRIC FILMS;

EID: 0032309704     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589808208034     Document Type: Article

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