The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor deposition

Journal of Applied Physics

Volumn 82, Issue 5, 1997, Pages 2497-2504

  Basceri, Cem ^a   Streiffer, S K ^a   Kingon, Angus I ^a   Waser, R ^b  

^a North Carolina State University   (United States)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CAPACITORS; ELECTRIC FIELD EFFECTS; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NUMERICAL ANALYSIS; OXIDES; POLARIZATION; RANDOM ACCESS STORAGE; TEXTURES; THERMAL EFFECTS; THIN FILMS;

BULK CURIE POINT; LANDAU-GINZBURG-DEVONSHIRE THEORY; POWER SERIES EXPANSION;

DIELECTRIC MATERIALS;

EID: 0031234721     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366062     Document Type: Article

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