Comparison of Schottky-limited and space-charge-limited currents in SrBi2Ta2O9 thin films

Integrated Ferroelectrics

Volumn 21, Issue 1 -4 pt 1, 1998, Pages 241-249

  Watanabe, Koji ^a   Hartmann, Andreas J ^a   Lamb, Robert N ^a   Scott, James F ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; INTERFACES (MATERIALS); LEAKAGE CURRENTS; OHMIC CONTACTS; PERMITTIVITY; SCHOTTKY BARRIER DIODES; STOICHIOMETRY; STRONTIUM COMPOUNDS; THERMAL EFFECTS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ROSE'S THEORY; SCHOTTKY CONTACT; SPACE-CHARGE-LIMITED CURRENT-VOLTAGE (SCLC) DEPENDENCE;

DIELECTRIC FILMS;

EID: 0032312977     PISSN: 10584587     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/10584589808202067     Document Type: Article

References (13)