Thickness dependence of the effective dielectric constant in a thin film capacitor

Applied Physics Letters

Volumn 73, Issue 5, 1998, Pages 632-634

  Natori, Kenji ^a   Otani, Daijiro ^a   Sano, Nobuyuki ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000062057     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121930     Document Type: Article

References (7)

1. S. M. Bilodeau, R. Carl, P. Van Buskirk, and J. Ward, Solid State Technol. 40, 235 (1997).
2. T. Horikawa, N. Mikami, T. Makita, J. Tanimura, M. Kataoka, K. Sato, and M. Nunoshita, Jpn. J. Appl. Phys., Part 1 32, 4126 (1993).
3. S. Yamamichi, H. Yabuta, T. Sakuma, and Y. Miyasaka, Appl. Phys. Lett. 64, 1644 (1994).
4. T. Kuroiwa, Y. Tsunemine, T. Horikawa, T. Makita, J. Tanimura, N. Mikami, and K. Sato, Jpn. J. Appl. Phys., Part 1 33, 5187 (1994).
5. T. Kawahara, M. Yamamuka, T. Makita, J. Naka, A. Yuuki, N. Mikami, and K. Ono, Jpn. J. Appl. Phys., Part 1 33, 5129 (1994).
6. See standard textbooks, e.g., H. Fröhlich, Theory of Dielectrics (Clarendon, Oxford, 1958)
7. or C. Kittel, Introduction to Solid State Physics, 7th ed. (Wiley, New York, 1996).