Grain-boundary defect chemistry of acceptor-doped titanates: Inversion layer and low-field conduction

Journal of the American Ceramic Society

Volumn 80, Issue 9, 1997, Pages 2301-2314

  Vollmann, Markus ^a,c   Hagenbeck, Rainer ^a   Waser, Rainer ^a,b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b AMERICAN CERAMIC SOCIETY   (United States)

^c Department of R and D   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY OF SOLIDS; GRAIN BOUNDARIES; IONIC CONDUCTION IN SOLIDS; STRONTIUM COMPOUNDS; THERMAL EFFECTS;

ADMITTANCE ANALYSIS; DEFECT CHEMISTRY; ELECTRONIC CONDUCTION;

CERAMIC MATERIALS;

EID: 0031236853     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb03121.x     Document Type: Article

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