Proton effects in charge-coupled devices

IEEE Transactions on Nuclear Science

Volumn 43, Issue 2 PART 1, 1996, Pages 614-627

  Hopkinson, G R ^a   Dale, C J ^b   Marshall, P W ^c  

^a Sira Ltd   (United Kingdom)

^b NAVAL RESEARCH LABORATORY   (United States)

^c SFA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CHARGE TRANSFER; ELECTRIC CURRENTS; ELECTRONS; INFRARED DEVICES; IONIZATION; IRRADIATION; PROTONS; SEMICONDUCTING SILICON;

DARK CURRENT; GATE DIELECTRIC; HUBBLE SPACE TELESCOPE; PROTON EFFECTS; SOLID STATE DETECTOR ARRAYS; TOTAL IONIZING DOSE EFFECTS;

RADIATION EFFECTS;

EID: 0030129829     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490905     Document Type: Article

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