Proton damage effects in an EEV CCD imager

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 1865-1871

  Hopkinson, G R ^a   Chlebek, C ^b  

^a Sira Ltd   (United Kingdom)

^b GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASTRONOMY; CONTROL SYSTEMS; PROTONS; X-RAYS;

CHARGE TRANSFER; DARK CHARGE SPIKES;

SEMICONDUCTOR DEVICES, CHARGE COUPLED;

EID: 0024929610     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45380     Document Type: Article

References (9)

1. E. G. Stassinopoulos, J.M. Barth and R. L. Smith, ‘ROSAT charged particle environment study’, NASA report X-600-87-13 (September 1987).
2. J. R. Srour, R. A. Hartmann and K. S. Kitazaki, “Permanent damage produced by single proton interactions in silicon devices”. IEEE Trans. Nucl. Sci, NS-36 (6)1, 1597–1604 (1986).
3. J. R. Janesick, T. Elliott and F. Pool, “Radiation damage in scientific charge-coupled devices”, IEEE Trans. Nucl. Sci.(1989).
4. G.R. Hopkinson, R. A.Cockshott, D. J.Purll, M.D. Skipper and B. Taylor, “Operation, performance and and reliability testing of charge coupled devices for star trackers.”
5. G. R. Hopkinson, “Evaluation of two dimensional GEC and Thomson-CSF CCD imaging arrays”, European Space Agency contract report, ESTEC ref 5254/82 (Oct 1986).
6. J. Van Der Spiegel and G. J. Declerck, “Characterisation of dark current non-uniformities in charge-coupled devices”, Solid State Electronics, 27(2), 147–154 (1984).
7. P.U. Calzolari, S. Graffi and C. Morandi, “Field-enhanced carrier generation in MOS capacitors”, Solid State Electronics, 17, 1001–1011 (1974).
8. E. Petersen, “Soft errors due to protons in the radiation belt”, IEEE Trans. Nucl. Sci, NS-28, 3981–3986 (1981).
9. E. A. Burke and G.P. Summers, “Extreme events produced by single particles”, IEEE Trans. Nucl. Sci. NS-34 (6), 1575–1579 (1987).