Permanent damage produced by single proton interactions in silicon devices

IEEE Transactions on Nuclear Science

Volumn 33, Issue 6, 1986, Pages 1597-1604

  Srour, J R ^a   Hartmann, R A ^a   Kitazaki, K S ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957089184     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1986.4334648     Document Type: Article

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