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Volumn 326, Issue 1-2, 1993, Pages 335-343
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The effect of bulk traps in proton irradiated EEV CCDs
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Author keywords
[No Author keywords available]
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Indexed keywords
ASTROPHYSICS;
MOS DEVICES;
PROTONS;
RADIATION DAMAGE;
X RAYS;
BULK TRAPS;
SHALLOW TRAPS;
CHARGE COUPLED DEVICES;
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EID: 0027557856
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(93)90374-Q Document Type: Article |
Times cited : (49)
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References (21)
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