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Volumn 326, Issue 1-2, 1993, Pages 335-343

The effect of bulk traps in proton irradiated EEV CCDs

Author keywords

[No Author keywords available]

Indexed keywords

ASTROPHYSICS; MOS DEVICES; PROTONS; RADIATION DAMAGE; X RAYS;

EID: 0027557856     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(93)90374-Q     Document Type: Article
Times cited : (49)

References (21)
  • 1
    • 0005351014 scopus 로고
    • Focal Plane CCD Imaging X-Ray Spectrometers For Two European Missions In The 1990'S
    • 2nd ed.
    • (1989) Proc. SPIE , vol.1153 , pp. 372
    • Wells1    Lumb2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.