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Applied Physics Letters

Volumn 54, Issue 5, 1989, Pages 451-453

Displacement damage equivalent to dose in silicon devices

(5) Dale, C J a Marshall, P W a Summers, G P a Wolicki, E A a Burke, E A b

a NAVAL RESEARCH LABORATORY (United States)

b MISSION RESEARCH CORPORATION (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001045449 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.100949 Document Type: Article

Times cited : (28)

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