Modeling Diffusion and Collection of Charge from Ionizing Radiation in Silicon Devices

IEEE Transactions on Electron Devices

Volumn 26, Issue 11, 1979, Pages 1742-1753

  Kirkpatrick, Scott ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON - CHARGE CARRIERS;

SEMICONDUCTOR DEVICES;

EID: 0018547168     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1979.19680     Document Type: Article

References (9)

1. T. C. May and M. H. Woods, IEEE Trans. Electron Devices, vol. ED-26, pp. 2–9, Jan. 1979.
2. D. S. Yaney, J. T. Nelson, and L. L. Vanskike, IEEE Trans. Electron Devices, vol. ED-26, pp. 10–16, Jan. 1979.
3. J. F. Ziegler, The Stopping and Range of Ions in Matter, Vol. 4: He. New York: Pergamon, 1977.
4. H. H. Anderson and J. F. Ziegler, The Stopping and Range of Ions in Matter, Vol. 3: H. New York: Pergamon, 1977.
5. Semiconductor Nuclear-Particle Detectors and Circuits. National Academy of Sciences Publication 1593, 1969. See particularly the articles by G. Forcinal, P. Siffert, and A. Cache, pp. 37ff, and by G. Dearnaley, pp. 5ff in this volume. A. G. Chynoweth, Semiconductor Nuclear-Particle Detectors. National Academy of Science Publication 871, 1961, pp. 95ff.
6. S. M. Sze, Physics of Semiconductor Devices. New York: Wiley, 1969.
7. M. Abramowitz and I. A. Stegun, Eds., Handbook of Mathematical Functions. Washington, DC: Nat. Bur. Stand., 1964, p. 374.
8. R. C. Varshney and K. Venkataswaran, IEEE. J. Solid-State Circuits, vol. SC-13, p. 681, 1978.
9. R. H. Dennard, F. H. Gaensslen, H.-N. Yu, V. L. Rideout, E. Bassous, and A. R. LeBlanc, IEEE. J. Solid-State Circuits, vol. SC-9, p. 256, 1974.