Imaging charge-coupled device (CCD) transient response to 17 and 50 MeV proton and heavy-ion irradiation

IEEE Transactions on Nuclear Science

Volumn 37, Issue 6, 1990, Pages 1876-1885

  Lomheim, T S ^a   Shima, R M ^a   Angione, J R ^a   Woodward, W F ^a   Asman, D J ^a   Keller, R A ^a   Schumann, L W ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; PROTONS; SEMICONDUCTING SILICON;

HEAVY IONS;

SEMICONDUCTOR DEVICES, CHARGE COUPLED;

EID: 0025683826     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.101204     Document Type: Article

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