Proton-Induced Charge Transfer Degradation In Ccds For Near-Room Temperature Applications

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 1984-1991

  Hopkins, I H ^a   Hopkinson, G R ^b   Johlander, B ^c  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b Sira Ltd   (United Kingdom)

^c EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CHARGE TRANSFER; ELECTRIC CHARGE; ELECTRIC VARIABLES MEASUREMENT; ELECTRON EMISSION; LOW TEMPERATURE EFFECTS; OPTICAL DEVICES; PHOTODETECTORS; PROTONS; RADIATION EFFECTS;

BACKGROUND CHARGE; CHARGE TRANSFER INEFFICIENCY; TRAP EMISSION TIMES;

CHARGE COUPLED DEVICES;

EID: 0028705536     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340533     Document Type: Article

References (15)

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