-
4
-
-
84909904844
-
-
ASTM Standard E665. Standard practice for determining absorbed dose versus depth in materials exposed to X-ray output of flash X-ray machines. ASTM Standards, Vol. 12.02: Nuclear (II), Solar and Geothermal Energy, pp. 299–5400. American Society for Testing and Materials, Philadelphia, PA.
-
-
-
-
5
-
-
84909904843
-
-
ASTM Standard E666. Standard practice for calculation of absorbed dose from gamma or X-radiation. ASTM Standards, Vol. 12.02: Nuclear (II), Solar and Geothermal Energy, pp. 299–5400. American Society for Testing and Materials, Philadelphia, PA.
-
-
-
-
6
-
-
84909904842
-
-
ASTM Standard E668. Standard practice for application of thermoluminescence-dosimeter (TLD) systems for determining electronic devices. ASTM Standards, Vol. 12.02: Nuclear (II), Solar and Geothermal Energy, pp. 299–5400. American Society for Testing and Materials, Philadelphia, PA.
-
-
-
-
26
-
-
0001660156
-
Formation of interface traps in metal-oxide-semiconductor devices during isochronal annealing after irradiation at 78 K
-
(1991)
Journal of Applied Physics
, vol.70
, pp. 7434
-
-
Brown1
Saks2
-
41
-
-
0016993952
-
Determination of insulator bulk trapped charge densities and centroids from photocurrent-voltage charactersitcs of MOS structures
-
(1976)
Journal of Applied Physics
, vol.47
, pp. 4073
-
-
Di Maria1
-
53
-
-
84909904839
-
-
ESA/SCC Basic Specification No. 22900. Total dose steady-state irradiation test method.
-
-
-
-
57
-
-
0001649726
-
Effect of bias on the response of metal-oxide-semiconductor devices to low-energy X-ray and cobalt-60 irradiation
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 1514
-
-
Fleetwood1
Winokur2
-
78
-
-
84909904838
-
2 system after high field stress and after X-irradiation
-
Princeton University
-
(1980)
Ph.D. Dissertation
-
-
Hu1
-
80
-
-
0000791441
-
2: direct measurement of the drift mobility and lifetime
-
(1973)
Phys. Rev. Lett.
, vol.30
, pp. 1333
-
-
Hughes1
-
88
-
-
84909904836
-
-
IEC 544-1. Guide for Determining the Effects of Ionizing Radiation on Insulating Materials, Part 1: Radiation Interaction and Dosimetry.
-
-
-
-
90
-
-
84963593424
-
Zur Theorie der Ionisation in Kolonnen
-
reprinted in, Phys. Z. 15 1914 353
-
(1913)
Annalen der Physik
, vol.42
, pp. 303
-
-
Jaffe1
-
91
-
-
1842859173
-
-
(1929)
Phys. Z.
, vol.23
, pp. 849
-
-
-
95
-
-
36549096569
-
Electron-spin-resonance study of radiation-induced paramagnetic defects in oxides grown on (100) silicon substrates
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 3551
-
-
Kim1
Lenahan2
-
97
-
-
0020751109
-
Interface trap generation in silicon dioxide when electrons are captured by trapped holes
-
(1983)
J. Appl. Phys.
, vol.54
, pp. 2540
-
-
Lai1
-
113
-
-
84909904834
-
-
2 during ionizing radiation exposure. Appl. Phys. Lett. 57, 2237.
-
-
-
-
117
-
-
0008560925
-
A direct tunneling of charge transfer at the insulator-semiconductor interface in MIS devices
-
HDL-TR-1765
-
(1976)
U.S. Government Report
-
-
McLean1
-
119
-
-
0000947294
-
Simple approximate solutions to continuous-time-random-walk transport
-
(1977)
Phys. Rev. B
, vol.15
, pp. 1052
-
-
McLean1
Ausmann2
-
128
-
-
0037826992
-
Electron spin resonance study of interface states induced by electron injection in metal-oxide semiconductor devices
-
(1986)
J. Appl. Phys.
, vol.59
, pp. 2054
-
-
Mikawa1
Lenahan2
-
130
-
-
84909904833
-
-
MIL-STD-883C, Method 1019.4. Steady state total dose irradiation procedure.
-
-
-
-
134
-
-
0016972499
-
High-field capture of electrons by Coulomb-attractive centers in silicon dioxide
-
(1976)
J. Appl. Phys.
, vol.47
, pp. 3203
-
-
Ning1
-
157
-
-
35949027117
-
Stochastic transport in a disordered solid I theory
-
(1973)
Phys. Rev. B.
, vol.7
, pp. 4491
-
-
Scher1
Lax2
-
175
-
-
0018154439
-
2 interface, a model based on trivalent silicon and its hydrogen “compounds”
-
S. Pandalides, Pergamon Press, New York
-
(1978)
2 and its Interfaces
, pp. 328
-
-
Svensson1
-
176
-
-
0001379310
-
Field dependence of two large hole capture cross sections in thermal oxide on silicon
-
(1983)
Appl. Phys. Lett.
, vol.43
, pp. 861
-
-
Tzou1
Sun2
Sah3
|