Total Dose And Proton Testing Of A Commercial Hgcdte Array

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 1966-1973

  Hopkinson, G R ^a   Baddiley, C J ^b   Guy, D R P ^b   Parsons, J E ^c  

^a Sira Ltd   (United Kingdom)

^b DRA   (United Kingdom)

^c GEC Marconi Infrared Limited   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ARRAYS; CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; IONIZATION OF SOLIDS; LEAKAGE CURRENTS; MULTIPLEXING EQUIPMENT; PHOTODETECTORS; PROTONS; RADIATION EFFECTS; THERMAL EFFECTS;

PHOTODIODE ARRAY; PROTON IRRADIATION; RADIATION TOLERANCE;

PHOTODIODES;

EID: 0028712339     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340531     Document Type: Article

References (14)

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