-
1
-
-
0025842112
-
The Effects of Proton Damage on Charge-Coupled Devices
-
J. Janesick, G. Soli, T. Elliott, and S. Collins, “The Effects of Proton Damage on Charge-Coupled Devices,” Proc. SPIE, Vol. 1447, pp. 87–108, 1991.
-
(1991)
Proc. SPIE
, vol.1447
, pp. 87-108
-
-
Janesick, J.1
Soli, G.2
Elliott, T.3
Collins, S.4
-
2
-
-
0024611260
-
Radiation Damage in Scientific Charge-Coupled Devices
-
Feb.
-
J. Janesick, T. Elliott, and F. Pool, “Radiation Damage in Scientific Charge-Coupled Devices,” IEEE Trans. on Nucl. Sci., Vol. NS-36, No.1, pp. 572–578, Feb. 1989.
-
(1989)
IEEE Trans. on Nucl. Sci
, vol.NS-36
, Issue.1
, pp. 572-578
-
-
Janesick, J.1
Elliott, T.2
Pool, F.3
-
3
-
-
0026388816
-
Techniques for Minimizing Space Proton Damage in Scientific Charge Coupled Devices
-
A. Holland, A. Holmes-Siedle, B. Johlander, and L. Adams, “Techniques for Minimizing Space Proton Damage in Scientific Charge Coupled Devices,” IEEE Trans. Nucl. Sci., Vol. NS-38, No. 6, pp. 1663–1670.
-
IEEE Trans. Nucl. Sci
, vol.NS-38
, Issue.6
, pp. 1663-1670
-
-
Holland, A.1
Holmes-Siedle, A.2
Johlander, B.3
Adams, L.4
-
4
-
-
0027557856
-
The Effect of Bulk Traps in Proton Irradiated EEV CCDs
-
A. Holland, “The Effect of Bulk Traps in Proton Irradiated EEV CCDs,” NIM A326, pp. 335–343, 1993.
-
(1993)
NIM A326
, pp. 335-343
-
-
Holland, A.1
-
5
-
-
0023594012
-
Correlation of Particle-Induced Displacement Damage in Silicon
-
Dec.
-
G.P. Summers, E.A. Burke, C.J. Dale, E.A. Wolicki, P.W. Marshall, and M.A. Gehlhausen, “Correlation of Particle-Induced Displacement Damage in Silicon,” IEEE Trans. on Nucl. Sci., Vol. NS-34, No.6, pp. 1134–1139, Dec. 1987.
-
(1987)
IEEE Trans. Nucl. Sci
, vol.NS-34
, Issue.6
, pp. 1134-1139
-
-
Summers, G.P.1
Burke, E.A.2
Dale, C.J.3
Wolicki, E.A.4
Marshall, P.W.5
Gehlhausen, M.A.6
-
6
-
-
0024902703
-
The Generation Lifetime Damage Factor and its Variance in Silicon
-
Dec.
-
C.J. Dale, P.W. Marshall, E.A. Burke, G.P. Summers, and G.E. Bender, “The Generation Lifetime Damage Factor and its Variance in Silicon,” IEEE Trans. on Nucl. Sci., Vol. NS-36, No.6, pp. 1872–1881, Dec. 1989.
-
(1989)
IEEE Trans. on Nucl. Sci
, vol.NS-36
, Issue.6
, pp. 1872-1881
-
-
Dale, C.J.1
Marshall, P.W.2
Burke, E.A.3
Summers, G.P.4
Bender, G.E.5
-
7
-
-
0024174933
-
Displacement Damage in GaAs Structures
-
Dec.
-
G.P. Summers, E.A. Burke, M.A. Xapsos, C.J. Dale, P.W. Marshall, and E.L. Petersen, “Displacement Damage in GaAs Structures,” IEEE Trans. Nucl. Sci., Vol. NS-35, No. 6, pp. 1221–1226, Dec. 1988.
-
(1988)
IEEE Trans. Nucl. Sci
, vol.NS-35
, Issue.6
, pp. 1221-1226
-
-
Summers, G.P.1
Burke, E.A.2
Xapsos, M.A.3
Dale, C.J.4
Marshall, P.W.5
Petersen, E.L.6
-
8
-
-
0001045449
-
Displacement damage equivalent to dose in silicon devices
-
Jan.
-
C.J. Dale, P.W. Marshall, G.P. Summers, and E.A. Wolicki, “Displacement damage equivalent to dose in silicon devices,” Appl. Phys. Lett., Vol. 54, No. 5, pp. 451–453, Jan. 1989.
-
(1989)
Appl. Phys. Lett
, vol.54
, Issue.5
, pp. 451-453
-
-
Dale, C.J.1
Marshall, P.W.2
Summers, G.P.3
Wolicki, E.A.4
-
9
-
-
84958487964
-
Further developments of CCD X-ray detectors for astronomy
-
A.D. Holland, D.H. Lumb and C. Castelli, “Further developments of CCD X-ray detectors for astronomy,” Proc. SPIE 1159, p. 113, 1989.
-
(1989)
Proc. SPIE
, vol.1159
, pp. 113
-
-
Holland, A.D.1
Lumb, D.H.2
Castelli, C.3
-
10
-
-
0025540076
-
Proton damage effects in EEV charge couple devices
-
A. Holland, A. Abbey and K. McCarthy, “Proton damage effects in EEV charge couple devices,” Proc. SPIE, Vol. 1344, p. 378, 1990.
-
(1990)
Proc. SPIE
, vol.1344
, pp. 378
-
-
Holland, A.1
Abbey, A.2
McCarthy, K.3
-
11
-
-
84939386173
-
-
Private communication with George Soli of JPL
-
Private communication with George Soli of JPL.
-
-
-
-
12
-
-
84939395071
-
-
Private communication with Jim Janesick of JPL
-
Private communication with Jim Janesick of JPL.
-
-
-
-
13
-
-
84939355215
-
-
Private communication with Tom Elliott of JPL
-
Private communication with Tom Elliott of JPL.
-
-
-
-
14
-
-
0022890049
-
Energy Dependence of Proton-Induced Displacement Damage in Silicon
-
Dec.
-
E.A. Burke, “Energy Dependence of Proton-Induced Displacement Damage in Silicon,” IEEE Trans. Nucl. Sci., Vol. NS-33, No. 6, pp. 1276–1281, Dec. 1986.
-
(1986)
IEEE Trans. Nucl. Sci
, vol.NS-33
, Issue.6
, pp. 1276-1281
-
-
Burke, E.A.1
-
15
-
-
0025796121
-
Displacement Damage in Si Imagers for Space Applications
-
C.J. Dale and P.W. Marshall, “Displacement Damage in Si Imagers for Space Applications,” Proc. SPIE, Vol. 1447, pp. 70–86, 1991.
-
(1991)
Proc. SPIE
, vol.1447
, pp. 70-86
-
-
Dale, C.J.1
Marshall, P.W.2
-
16
-
-
0024630732
-
BRYNTRN: A Baryon Transport Model
-
March
-
J.W. Wilson, L.W. Townsend, J.E. Nealy, S.Y. Chun, B.S. Hong, W.W. Buck, S.L. Lamkin, B.D. Ganapol, F. Khan, and F.A. Cucinotta, “BRYNTRN: A Baryon Transport Model,” NASA Technical Paper 2887, March 1989.
-
(1989)
NASA Technical Paper 2887
-
-
Wilson, J.W.1
Townsend, L.W.2
Nealy, J.E.3
Chun, S.Y.4
Hong, B.S.5
Buck, W.W.6
Lamkin, S.L.7
Ganapol, B.D.8
Khan, F.9
Cucinotta, F.A.10
-
17
-
-
84939370985
-
Primary- and Secondary-Proton Dose Rates in Spheres and Slabs of Tissue
-
R. Wallace, P.G. Steward, and C. Sondhaus, “Primary- and Secondary-Proton Dose Rates in Spheres and Slabs of Tissue,” NASA SP-71, Second Symposium on Protection Against Radiations in Space, pp. 301–329, 1965.
-
(1965)
NASA SP-71, Second Symposium on Protection Against Radiations in Space
, pp. 301-329
-
-
Wallace, R.1
Steward, P.G.2
Sondhaus, C.3
-
18
-
-
84939326034
-
-
Although the proton environment of the SAA is anisotropic, this effect is averaged out during a mission since most spacecraft do not have a fixed orientation
-
Although the proton environment of the SAA is anisotropic, this effect is averaged out during a mission since most spacecraft do not have a fixed orientation.
-
-
-
-
19
-
-
77949570528
-
Improvements in Computational Accuracy of BRYNTRN (A Baryon Transport Code)
-
May
-
J.L. Shinn, J.W. Wilson, M. Weyland, and F.A. Cucinotta, “Improvements in Computational Accuracy of BRYNTRN (A Baryon Transport Code),” NASA Technical Paper 3093, May 1991.
-
(1991)
NASA Technical Paper 3093
-
-
Shinn, J.L.1
Wilson, J.W.2
Weyland, M.3
Cucinotta, F.A.4
-
20
-
-
84939353905
-
-
Private communication with Francis Cucinotta
-
Private communication with Francis Cucinotta.
-
-
-
-
21
-
-
0041483699
-
Spacecraft displacement damage dose calculations for shielded CCDs
-
C.J. Dale, P.W. Marshall, B. Cummings, L. Shamey, and A. Delamere, “Spacecraft displacement damage dose calculations for shielded CCDs,” SPIE Vol. 1656, pp.476-487, 1992.
-
(1992)
SPIE
, vol.1656
, pp. 476-487
-
-
Dale, C.J.1
Marshall, P.W.2
Cummings, B.3
Shamey, L.4
Delamere, A.5
-
22
-
-
84939377600
-
-
Some space experiments are contaminated by the gamma rays emitted as activated nuclei decay. This activation problem would be worse for Ta than Al because of the increased number of nuclear reactions per unit mass
-
Some space experiments are contaminated by the gamma rays emitted as activated nuclei decay. This activation problem would be worse for Ta than Al because of the increased number of nuclear reactions per unit mass.
-
-
-
-
23
-
-
0017728599
-
Investigation of bulk electron traps created by fast neutron irradiation in a buried channel CCD
-
Dec
-
N.S. Saks, “Investigation of bulk electron traps created by fast neutron irradiation in a buried channel CCD,” IEEE Trans. Nucl. Sci., Vol. NS-24, No. 6, pp. 2153–2157, Dec 1977.
-
(1977)
IEEE Trans. Nucl. Sci
, vol.NS-24
, Issue.6
, pp. 2153-2157
-
-
Saks, N.S.1
-
24
-
-
0019279984
-
Transient and permanent effects of neutron bombardment on a commericially available n-buried channel CCD
-
Dec.
-
J.R. Srour, R.A. Hartmann and S. Othmer, “Transient and permanent effects of neutron bombardment on a commericially available n-buried channel CCD,” IEEE Trans. Nucl. Sci., Vol. NS-27, No. 6, pp. 1402–1410, Dec. 1980.
-
(1980)
IEEE Trans. Nucl. Sci
, vol.NS-27
, Issue.6
, pp. 1402-1410
-
-
Srour, J.R.1
Hartmann, R.A.2
Othmer, S.3
-
25
-
-
0016128631
-
The Effects of Bulk Traps on the Performance of Bulk Channel Charge-Coupled Devices
-
Nov.
-
A.M. Mohsen and M.F. Tompsett, “The Effects of Bulk Traps on the Performance of Bulk Channel Charge-Coupled Devices,” IEEE Trans. El. Dev., Vol. ED-21, No. 11, pp. 701–712, Nov. 1974.
-
(1974)
IEEE Trans. El. Dev
, vol.ED-21
, Issue.11
, pp. 701-712
-
-
Mohsen, A.M.1
Tompsett, M.F.2
-
26
-
-
0020769807
-
Low-Temperature Characteristics of Buried-Channel Charge-Coupled Devices
-
June
-
M. Kimata, M. Denda, N. Yutani, N. Tsubouchi and S. Uematsu, “Low-Temperature Characteristics of Buried-Channel Charge-Coupled Devices,” Jap, J. Appl. Phys., Vol. 22, No. 6, pp. 975–980, June 1983.
-
(1983)
Jap, J. Appl. Phys
, vol.22
, Issue.6
, pp. 975-980
-
-
Kimata, M.1
Denda, M.2
Yutani, N.3
Tsubouchi, N.4
Uematsu, S.5
-
27
-
-
0026152433
-
A Model for Charge Transfer in Buried-Channel Charge-Coupled Devices at Low Temperature
-
May
-
E.K. Banghart, J.P. Lavine, E.A. Trabka, E.T. Nelson, and B.C. Burkey, “A Model for Charge Transfer in Buried-Channel Charge-Coupled Devices at Low Temperature,” IEEE Trans. El. Dev., Vol. 38, No. 5, pp. 1162–1173, May 1991.
-
(1991)
IEEE Trans. El. Dev
, vol.38
, Issue.5
, pp. 1162-1173
-
-
Banghart, E.K.1
Lavine, J.P.2
Trabka, E.A.3
Nelson, E.T.4
Burkey, B.C.5
-
28
-
-
0026994601
-
Degradation of the Charge Transfer Efficiency of a Buried Channel Charge Coupled Device Due to Radiation Damage by a Beta Source
-
M.S. Robbins, T. Roy and S.J. Watts, “ Degradation of the Charge Transfer Efficiency of a Buried Channel Charge Coupled Device Due to Radiation Damage by a Beta Source,” Proc. RADECS 91, Vol. 15, 327–332, 1991.
-
(1991)
Proc. RADECS 91
, vol.15
, pp. 327-332
-
-
Robbins, M.S.1
Roy, T.2
Watts, S.J.3
-
29
-
-
1242309542
-
Annealing of proton-induced displacement damage in CCDs for space use
-
A.D. Holland, “Annealing of proton-induced displacement damage in CCDs for space use,” Inst. Phys. Conf. Ser. 121, pp. 33–40, 1991.
-
(1991)
Inst. Phys. Conf. Ser
, vol.121
, pp. 33-40
-
-
Holland, A.D.1
-
30
-
-
0020169807
-
Defect Production and Lifetime Control in Electron and μ-Irradiated Silicon
-
S.D. Brotherton and P. Bradley, “Defect Production and Lifetime Control in Electron and γ-Irradiated Silicon,” J. Appl. Phys., Vol. 53, pp. 5720–5732, 1982.
-
(1982)
J. Appl. Phys
, vol.53
, pp. 5720-5732
-
-
Brotherton, S.D.1
Bradley, P.2
-
31
-
-
0017631852
-
Capacitance Transient Spectroscopy
-
G.L. Miller, D.V. Lang, and L.C. Kimerling, “Capacitance Transient Spectroscopy,” Ann. Rev. Mater. Sci. 1977, pp. 377–448, 448, 1977.
-
(1977)
Ann. Rev. Mater. Sci
, vol.448
, pp. 377-448
-
-
Miller, G.L.1
Lang, D.V.2
Kimerling, L.C.3
-
32
-
-
0001759991
-
Properties of 1.0-MeV-Electron-Irradiated Defect Centers in Silicon
-
J.W. Walker and C.T. Sah, “Properties of 1.0-MeV-Electron-Irradiated Defect Centers in Silicon,” Phys. Rev. B, Vol.7, No.10, pp. 4587–4605, 1973.
-
(1973)
Phys. Rev. B
, vol.7
, Issue.10
, pp. 4587-4605
-
-
Walker, J.W.1
Sah, C.T.2
-
33
-
-
84939361554
-
-
Private communication with Mark Bautz of MIT/Lincoln Laboratory
-
Private communication with Mark Bautz of MIT/Lincoln Laboratory.
-
-
-
-
34
-
-
84939338380
-
-
Private communication with Tony Armstrong of SAIC
-
Private communication with Tony Armstrong of SAIC.
-
-
-
-
35
-
-
0040588011
-
A Thick-Target Radiation Transport Computer Code for Low-Mass Heavy Ion Beams
-
T.W. Armstrong and B.L. Colborn, “A Thick-Target Radiation Transport Computer Code for Low-Mass Heavy Ion Beams,” NIM, Vol. 169, p. 161 (1980).
-
(1980)
NIM
, vol.169
, pp. 161
-
-
Armstrong, T.W.1
Colborn, B.L.2
-
36
-
-
0001511291
-
HETC, A High Energy Transport Code
-
T.W. Armstrong and K.C. Chandler, “HETC, A High Energy Transport Code,” Nucl. Sci. Eng., Vol. 49, p. 110 (1972).
-
(1972)
Nucl. Sci. Eng
, vol.49
, pp. 110
-
-
Armstrong, T.W.1
Chandler, K.C.2
|