Displacement damage in Si imagers for space applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1447, Issue , 1991, Pages 70-86

  Dale, Cheryl J ^a   Marshall, Paul W ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES--SPACE APPLICATIONS; NEUTRONS--EMISSION; PARTICLE BEAMS; RADIATION DAMAGE--MEASUREMENTS; SEMICONDUCTING SILICON--APPLICATIONS;

CHARGE TRANSFER INEFFICIENCY; IMAGER DEGRADATION; PARTICLE INDUCED DISPLACEMENT DAMAGE; SECONDARY NEUTRON PRODUCTION; SILICON IMAGERS; SOLID STATE IMAGERS;

SOLID STATE DEVICES;

EID: 0025796121     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (42)