Depletion Region Geometry Analysis Applied to Single Event Sensitivity

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 2427-2434

  Langworthy, James B ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SATELLITES--COMPONENTS; SEMICONDUCTOR DEVICE TESTING--RADIATION EFFECTS; SPACECRAFT--COMPONENTS;

DEPLETION REGION; DEVICE GEOMETRY; LINEAR ENERGY TRANSFER; SINGLE EVENT UPSET; SPACE RADIATION EFFECTS;

SEMICONDUCTOR DEVICES;

EID: 0024942859     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45460     Document Type: Article

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