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Volumn 1953, Issue , 1993, Pages 71-81

Effects of space radiation damage and temperature on CCD noise for the lyman fuse mission

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CHARGE TRANSFER; DARK CURRENTS; SPECTRAL DENSITY; THERMAL NOISE; ULTRAVIOLET SPECTROSCOPY;

EID: 77957731892     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.156564     Document Type: Conference Paper
Times cited : (5)

References (11)
  • 4
    • 85076047144 scopus 로고
    • 'The effects of proton damage on charge-coupled devices
    • James Janesick, George Soli, Tom Elliot and Stewart Collins, 'The Effects of Proton Damage on Charge-Coupled Devices, " SPIE Vol 1147, 1991.
    • (1991) SPIE , vol.1147
    • James, J.1    George, S.2    Tom, E.3    Stewart, C.4
  • 6
  • 7
    • 0026105822 scopus 로고
    • Dynamic suppression of interface-state dark current in burned channel ccd's
    • Barry E. Burke and Stephanie A. Gajar, "Dynamic Suppression of Interface-State Dark Current in Burned Channel CCD's, " IEEE trans. on Electron Devices vol 38, 285 (1991).
    • (1991) IEEE Trans. On Electron Devices , vol.38 , pp. 285
    • Barry, E.B.1    Stephanie, A.G.2
  • 8
    • 0027611896 scopus 로고
    • 'Effects of space radiation damage and temperature on the noise in ccds and ldd mos transistors
    • on Nuclear Science
    • R. Murowinski, G. Linzhuang, M. Deen, 'Effects of Space Radiation Damage and Temperature on the Noise in CCDs and LDD MOS Transistors, " to appear in IEEE trans. on Nuclear Science Vol 40 No 3 (1993).
    • (1993) To Appear in IEEE Trans , vol.40 , Issue.3
    • Murowinski, R.1    Linzhuang, G.2    Deen, M.3
  • 9
    • 0025423651 scopus 로고
    • A new method of measuring the threshold voltage for small geometry mosfets from subthreshold conduction
    • Vol 33, May
    • M.J. Deen and Z.X. Yan, "A New Method of Measuring the Threshold Voltage for Small Geometry MOSFETs from Subthreshold Conduction, " Solid-State Electronics, Vol 33(5), pp. 503-512 (May 1990).
    • (1990) Solid-State Electronics , Issue.5 , pp. 503-512
    • Deen, M.J.1    Yan, Z.X.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.