Degradation of the charge transfer efficiency of a buried channel charge coupled device due to radiation damage by a beta source

First European Conference on Radiation and Its Effects on Devices and Systems - RADECS 91

Volumn , Issue , 1992, Pages 327-332

  Robbins, M S ^a   Roy, T ^a   Watts, S J ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRONS; SEMICONDUCTING SILICON;

BETA SOURCES; CHARGE TRANSFER;

RADIATION DAMAGE;

EID: 0026994601     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)