메뉴 건너뛰기




Volumn 39, Issue 6, 1992, Pages 2018-2025

Cobalt60 and proton radiation effects on large format, 2-D, CCD arrays for an earth imaging application

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000789729     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211399     Document Type: Article
Times cited : (57)

References (19)
  • 1
    • 0026388816 scopus 로고
    • Techniques for minimising space proton damage in scientific charge coupled devices
    • A. Holland, A. Holmes-Seidle, B. Johlander and L. Adams, “Techniques for minimising space proton damage in scientific charge coupled devices”, IEEE Trans on Nuclear Science NS-38(6), pp. 1663–1670, (1991).
    • (1991) IEEE Trans on Nuclear Science , vol.NS-38 , Issue.6 , pp. 1663-1670
    • Holland, A.1    Holmes-Seidle, A.2    Johlander, B.3    Adams, L.4
  • 2
    • 0026105822 scopus 로고
    • Dynamic suppression of interface-state dark current in buried channel CCDs
    • B. Burke and S. A. Gajar, “Dynamic suppression of interface-state dark current in buried channel CCDs”, IEEE Trans on Electron Devices, 38(2), pp. 285–290 (1991).
    • (1991) IEEE Trans on Electron Devices , vol.38 , Issue.2 , pp. 285-290
    • Burke, B.1    Gajar, S.A.2
  • 3
    • 0009126992 scopus 로고
    • Recombination along the tracks of heavy charged particles in SiO2 films
    • T. R. Oldham, “Recombination along the tracks of heavy charged particles in SiO 2 films”, J. Appl. phys., 57(8), pp. 2695–2702 (1985).
    • (1985) J. Appl. phys , vol.57 , Issue.8 , pp. 2695-2702
    • Oldham, T.R.1
  • 5
    • 0026994601 scopus 로고
    • Degradation of the charge transfer efficiency of a buried channel charge coupled device due to radiation damage by a beta source
    • M. S. Robbins, T. Roy and S. J. Watts, “Degradation of the charge transfer efficiency of a buried channel charge coupled device due to radiation damage by a beta source”, RADECS 91, IEEE Proceedings, pp. 327–332 (1992).
    • (1992) RADECS 91, IEEE Proceedings , pp. 327-332
    • Robbins, M.S.1    Roy, T.2    Watts, S.J.3
  • 6
    • 0027001608 scopus 로고
    • Radiation effects on CCDs for spaceborne acquisition and tracking applications
    • G. R. Hopkinson, “Radiation effects on CCDs for spaceborne acquisition and tracking applications”, RADECS 91, IEEE Proceedings, pp. 368–372 (1992).
    • (1992) RADECS 91, IEEE Proceedings , pp. 368-372
    • Hopkinson, G.R.1
  • 7
    • 0024929610 scopus 로고
    • Proton damage effects in an EEV CCD imager
    • G. R. Hopkinson and Ch. Chlebek, “Proton damage effects in an EEV CCD imager”, IEEE trans on Nuclear Science, NS-36(6), pp. 1865–1871 (1989).
    • (1989) IEEE trans on Nuclear Science , vol.NS-36 , Issue.6 , pp. 1865-1871
    • Hopkinson, G.R.1    Chlebek, C.2
  • 9
    • 0026152433 scopus 로고
    • A model for charge transfer in buried channel charge-coupled devices at low temperature
    • E. K. Banghart, J. P. Lavine, E. A. Trabka, E. T. Nelson and B. C. Burkey, “A model for charge transfer in buried channel charge-coupled devices at low temperature, IEEE Trans on Electron Devices, ED-38(3), pp. 1162–1174 (1991).
    • (1991) IEEE Trans on Electron Devices , vol.ED-38 , Issue.3 , pp. 1162-1174
    • Banghart, E.K.1    Lavine, J.P.2    Trabka, E.A.3    Nelson, E.T.4    Burkey, B.C.5
  • 10
    • 0025669255 scopus 로고
    • Proton-induced displacement damage distributions and extremes in silicon microvolumes
    • P. W Marshall, C. J. Dale and E. A. Burke, “Proton-induced displacement damage distributions and extremes in silicon microvolumes”, IEEE Trans on Nuclear Science, NS-37(6), pp. 1776–1783 (1990).
    • (1990) IEEE Trans on Nuclear Science , vol.NS-37 , Issue.6 , pp. 1776-1783
    • Marshall, P.W.1    Dale, C.J.2    Burke, E.A.3
  • 11
    • 0024915865 scopus 로고
    • Enhanced displacement damage effectiveness in irradiated silicon devices
    • J. R. Srour and R. A. Hartmann, “Enhanced displacement damage effectiveness in irradiated silicon devices”, IEEE Trans on Nuclear Science, NS-36(6), pp. 1825–1830 (1989).
    • (1989) IEEE Trans on Nuclear Science , vol.NS-36 , Issue.6 , pp. 1825-1830
    • Srour, J.R.1    Hartmann, R.A.2
  • 16
    • 0024619556 scopus 로고
    • Radiation damage effects on imaging charge coupled devices
    • T. Roy, S. J. Watts and D. Wright, “Radiation damage effects on imaging charge coupled devices”, Nuclear Instruments and Methods, A27, pp. 545–557 (1989).
    • (1989) Nuclear Instruments and Methods , vol.2A7 , pp. 545-557
    • Roy, T.1    Watts, S.J.2    Wright, D.3
  • 17
    • 0019040462 scopus 로고
    • A technique for suppressing dark current generated by interface states in buried channel CCD imagers
    • N. S. Saks, “A technique for suppressing dark current generated by interface states in buried channel CCD imagers”, IEEE Electron Device Letters, EDL-1(7), pp. 131–133 (1980).
    • (1980) IEEE Electron Device Letters , vol.EDL-1 , Issue.7 , pp. 131-133
    • Saks, N.S.1
  • 19
    • 84939766271 scopus 로고
    • Two tricks for antiblooming operation
    • May 10
    • J. R. Janesick, “Two tricks for antiblooming operation”, JPL Memorandum, May 10, 1990.
    • (1990) JPL Memorandum
    • Janesick, J.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.