Fano-noise-limited ccds

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 982, Issue , 1988, Pages 70-95

  Janesick, James ^a   Elliott, Tom ^a   Bredthauer, Richard ^b   Chandler, Charles ^b   Burke, Barry ^c  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b Safety and Mission Assurance Manager Space Systems Loral   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; FLOORS; X RAYS;

CHARGE TRANSFER EFFICIENCY; ELECTRON LEVELS; ELECTRON PEAK; ENERGY RESOLUTIONS; EXTREME ULTRAVIOLETS; MODULATION IMAGES; SCIENTIFIC CCDS; STATISTICAL VARIATIONS;

X RAY DETECTORS;

EID: 84935474603     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.948704     Document Type: Conference Paper

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