Experimental evaluation of high speed CCD imager radiation effects using Co60 and proton radiation

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1993, Pages 56-63

  Miller, T L ^a   Thompson, D A ^a   Elzinga, M B ^a   Lee, T H ^a   Passenheim, B C ^b   Leadon, R E ^b  

^a EASTMAN KODAK COMPANY   (United States)

^b TITAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CHARGE TRANSFER; ELECTRONIC EQUIPMENT TESTING; PROTON IRRADIATION; THRESHOLD VOLTAGE;

ACCUMULATION MODES; CHARGE TRANSFER INEFFICIENCY; DIFFUSION SOURCES; EXPERIMENTAL EVALUATION; FRAME READOUT RATE; PROTON RADIATIONS; SOURCE FOLLOWERS; THRESHOLD VOLTAGE SHIFTS;

RADIATION EFFECTS;

EID: 0005934199     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1993.700569     Document Type: Conference Paper

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