Counting of Deep-Level Traps Using a Charge Coupled Device

IEEE Transactions on Electron Devices

Volumn 34, Issue 12, 1987, Pages 2555-2557

  Mcgrath, R D ^a   Doty, J ^b   Lupino, G ^b   Ricker, G ^b   Vallerga, J ^b  

^a TEXAS INSTRUMENTS   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84887478269     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.23348     Document Type: Article

References (8)

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4. A. S. Grove, Physics and Technology of Semiconductor Devices. New York: Wiley, 1967.
5. S. M. Sze, Physics of Semiconductor Devices. New York: Wiley, 1981.
6. N. M. Johnson, in Proc. Mater. Res. Soc. Symp., vol. 69, p. 75, 1986.
7. J. Hynecek, IEEE Trans. Electron Devices, vol. ED-28, p. 483, 1981.
8. E. H. Nicollian and A. Goetzberger, Bell Syst. Tech. J., vol. 46, 1055, 1967.