Radiation effects in new materials for nano-devices

Microelectronic Engineering

Volumn 88, Issue 7, 2011, Pages 1259-1264

  Schrimpf, R D ^a   Fleetwood, D M ^a   Alles, M L ^a   Reed, R A ^a   Lucovsky, G ^b   Pantelides, S T ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Defects; Materials; Radiation effects; Reliability; Single event effects; Total dose

Indexed keywords

CATASTROPHIC FAILURES; ELECTRONIC DEVICE; FEATURE SIZES; NANO-DEVICES; PARAMETRIC DEGRADATION; SINGLE EVENT EFFECTS; TOTAL DOSE;

PARAMETRIC DEVICES;

RADIATION EFFECTS;

EID: 79958061197     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2011.03.117     Document Type: Conference Paper

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