Impact of ion energy and species on single event effects analysis

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2312-2321

  Reed, R A ^a,b   Weller, R A ^a,b   Mendenhall, M H ^c   Lauenstein, J M ^a,d   Warren, K M ^b   Pellish, J A ^a,b   Schrimpf, R D ^a,b   Sierawski, B D ^a,b   Massengill, L W ^a,b   Dodd, P E ^a,e   Shanevfelt, M R ^a,e   Felix, J A ^a,e   Schwank, J R ^a,e   Haddad, N K ^f   Lawrence, R K ^f   Bowman, J H ^f   Conde, K ^g  

^a IEEE   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d NASA GODDARD SPACE FLIGHT CENTER   (United States)

^e SANDIA NATIONAL LABORATORIES   (United States)

^f BAE SYSTEMS   (United States)

^g JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

Nuclear reactions; Single event effect rate; Single event effects (SEE)

Indexed keywords

NUCLEAR REACTIONS; SINGLE EVENT EFFECTS (SEE);

IRRADIATION; MERCURY (METAL); MONTE CARLO METHODS; NASA; RADIATION EFFECTS;

IONS;

EID: 37249087432     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.909901     Document Type: Conference Paper

References (28)

1. E. L. Petersen, "Predictions and observations of SEU rates in space," IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp. 2174-2187, Dec. 1997.
2. R. A. Reed, R. A. Weiler, R. D. Schrimpf, M. H. Mendenhall, K. M. Wanen, and L. W. Massengill, "Implications of nuclear reactions for single event effects test methods and analysis," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3356-3362, Dec. 2006.
3. K. M. Warren, R. A. Weiler, M. H. Mendenhall, R. A. Reed, D. R. Ball, C. L. Howe, B. D. Olson, M. L. Alles, L. W. Massengill, R. D. Schrimpf, N. F. Haddad, S. E. Doyle, D. McMorrow, J. S. Melinger, and W. T. Lotshaw, "The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM," IEEE Trans. Nuc Sci., vol. 52, no. 6, pp. 2125-2131, Dec. 2005.
4. P. E. Dodd, J. R. Schwank, M. R. Shaneyfelt, V. Ferlet-Cavrois, P. Paillet, J. Baggio, G. L. Hash, J. A. Felix, K. Hirose, and H. Saito, "Heavy ion energy effects in CMOS SRAMs," IEEE Trans. Nucl. Sci., vol. 54, no. 3, pp. 889-893, Jun. 2007.
5. P. E. Dodd, J. R. Schwank, M. R. Shaneyfelt, V. Ferlet-Cavrois, P. Paillet, J. Baggio, G. L. Hash, J. A. Felix, K. Hirose, and H. Saito, "Impact of heavy ion energy and nuclear interactions on single-event upset and latchup in integrated circuits," in Proc. NSREC Conf., Honolulu, HI, Jul. 2007, pp. 23-27.
6. R. Ecoffet, S. Duzellier, D. Falguere, L. Guibert, and C. Inguimbert, "Low LET cross-section measurements using high energy carbon beam," IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp. 2230-2236, Dec. 1997.
7. R. Koga, S. H. Crain, W. R. Crain, K. B. Crawford, and S. J. Hansel, "Comparative SEU sensitivities to relativistic heavy ions," IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2475-2482, Dec. 1998.
8. M. S. Liu, H. Y. Liu, N. Brewster, D. Nelson, K. W. Golke, G. Kirchner, H. L. Hughes, A. Campbell, and J. F. Ziegler, "Limiting upset cross sections of SEU hardened SOI SRAMs," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3487-3493, Dec. 2006.
9. M. Xapsos, "Applicability of LET to single events in microelectronic structures," IEEE Trans. Nucl. Sci., vol. 39, no. 6, pp. 1613-1621, Dec. 1992.
10. P. E. Dodd, O. Musseau, M. R. Shaneyfelt, F. W. Sexton, C D'hose, G. L. Hash, M. Martinez, R. A. Loemker, J.-I. Leray, and P. S. Winokur, "Impact of ion energy on single-event upset," IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2483-2491, Dec. 1998.
11. R. D. Schrimpf, R. A. Weiler, M. H. Mendenhall, R. A. Reed, and L. W. Massengill, "Physical mechanisms of single event effects in advanced microelectronics," Nucl. Instrum. Meth. B, vol. 261, no. 1-2, pp. 1133-1136, 1998.
12. K. M. Warren, R. A. Weiler. B. Sierawski, R. A. Reed, M. H. Mendenhall, R. D. Schrimpf, L. W. Massengill, M. Porter, J. Wilkinson, K. A. LaBel, and J. Adams, "Application of RADSAFE to model single event upset response of a 0.25 pm CMOS SRAM," IEEE Trans. Nucl. Sci., vol. 54, no. 3, pp. 898-903, Jun. 2007.
13. K. M. Wanen, B. D. Sierawski, R. A. Weiler, R. A. Reed, M. H. Mendenhall, J. A. Pellish, and R. D. Schrimpf, "Predicting thermal neutron induced soft error in static memories using monte-carlo simulations," IEEE Electron Device Lett., vol. 28, no. 2, pp. 180-182, Feb. 2007.
14. A. D. Tipton, J. A. Pellish, R. A. Reed, R. D. Schrimpf, R. A. Weiler, M. H. Mendenhall, B. Sierawski, A. K. Sutton, R. M. Diestelhorst, G. Espinel. J. D. Cressler, P. W. Marshall, and G. Vizkelethy. "Multiple-bit upset in 130 nm CMOS technology," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3259-3264, Dec. 2006.
15. D. R. Ball, K. M. Warren, R. A. Weller, R. A. Reed, A. Kobayashi, J. A. Pellish, M. H. Mendenhall, C. L. Howe, L. W. Massengill, R. D. Schrimpf, and N. F. Haddad, "Simulating nuclear events in a TCAD model of a high-density SEU hardened SRAM technology," IEEE Trans. Nucl. Sci., vol. 53, no. 4, pp. 1794-1789, Dec. 2006.
16. C. L. Howe, R. A. Weiler, R. A. Reed, R. D. Schrimpf, L. W. Massengill, K. M. Wanen, D. R. Ball, M. H. Mendenhall, K. A. LaBel, and J. W. Howard, Jr., "Monte Carlo study of radiation-induced energy deposition in scaled microelectronic structures," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 2182-2188, Dec. 2005.
17. J. C. Pickel, R. A. Reed, R. A. Weiler, M. H. Mendenhall, R. D. Schrimpf, R. Ladbury, G. Gee, B. Fodness, P. W. Marshall, T. M. Jordan, M. McKelvey, R. McMurray, K. Ennico, C. McCreight, A. Waczynski, E. Polidan, and S. Johnson, 'Transient radiation effects in ultra-low noise HgCdTe IR detector arrays for space-based astronomy," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 2657-2663, Dec. 2005.
18. A. S. Kobayashi, D. R. Ball, R. A. Reed, K. M. Warren, M. H. Mendenhall, R. D. Schrimpf, and R. A. Weiler, "The effect of metallization layers on single event susceptibility," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 2189-2193, Dec. 2005.
19. M. H. Mendenhall and R. A. Weiler, "An algorithm for computing screened coulomb scattering in Geant4," Nuc. Instrum. Meth. A, vol. 227, pp. 420-130, 2005.
20. R. A. Reed, P. W. Marshall, H. S. Kim, P. J. McNulty, B. Fodness, T. A. Jordan, R. Reedy, C. Tabbert, M. S. T. Liu, W. Heik'kila, S. Büchner, R. Ladbury, and K. A. LaBel, "Evidence for angular effects in protoninduced single-event upsets," IEEE Trans. Nucl. Sci., vol. 49, no. 6, pp. 3038-3044, Dec. 2002.
21. R. A. Weiler, M. H. Mendenhall, and D. M. Fleetwood, "A screened coulomb scattering module for displacement damage computations in Geant4," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3669-3678, Dec. 2004.
22. S. Agostinelli et al., "Geant4-a simulation toolkit," Nucl. Instrum. Meth. A. vol. 506, pp. 250-303, 2003.
23. N. Haddad, Private Communication.
24. [Online], Available: https://creme96.nrl.navy.mil/
25. R. Ladbury. R. A. Reed, P. W. Marshall, K. A. LaBel, R. Anantaraman, R. Fox, D. P. Sanderson, A. Stolz, J. Yurkon, A. F. Zeller, and J. W. Stetson, "Performance of the high-energy Single-Event Effects Test Facility (SEETF) at Michigan State University's National Superconducting Cyclotron Laboratory (NSCL)," IEEE Trans. Nuc. Sci., vol. 51, no. 6, pp. 3664-3668, Dec. 2004.
26. M. R. Shaneyfelt, P. E. Dodd, B. L. Draper, and R. S. Flores, "Challenges in hardening technologies using shallow-trench isolation," IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2584-2592, Dec. 1998.
27. T. Koi, "Ion transport simulation using geant4 hadronic physics," presented at the Monte Carlo Topical Meeting, Chattanooga, TN, Apr. 17-21, 2005, unpublished.
28. K. Kwiatkowski, S. H. Zhou, T. E. Ward, and V. E. Viola, "Energy deposition in intermediate-energy nucleon-nucleus collisions," Phys. Rev. Lett., vol. 50, no. 21, pp. 1648-1651, 1983.