Total dose radiation response of a 45nm SOI technology

Proceedings - IEEE International SOI Conference

Volumn , Issue , 2010, Pages

  Liu, S T ^a   Hurst, A ^a   Hughes, H L ^b   McMarr, P ^b   Benedito, J ^c   Capasso, C ^d  

^a TRUSTED Semiconductor Solutions   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c Radiation Assured Devices   (United States)

^d FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78650572032     PISSN: 1078621X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOI.2010.5641052     Document Type: Conference Paper

References (3)

1. P. Oldiges, et al., IEEE IEDM 16.3.1 (2009).
2. MIL-STD-883G, Method 1020.1.
3. S. T. Liu, et al.,IEEE TNS Vol. 45,2442(1998).