Production and propagation of single-event transients in high-speed digital logic ICs

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3278-3284

  Dodd, Paul E ^a   Shaneyfelt, Marty R ^a   Felix, James A ^a   Schwank, James R ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Integrated circuit reliability; Integrated circuit scaling; Integrated circuit testing; Radiation effects; Radiation hardening (electronics); Radiation response; Single event effects; Single event transient; Single event upset

Indexed keywords

COMPUTER SIMULATION; ENERGY TRANSFER; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; RADIATION EFFECTS; RADIATION HARDENING; SILICON ON INSULATOR TECHNOLOGY;

INTEGRATED CIRCUIT RELIABILITY; RADIATION HARDENING (ELECTRONICS); RADIATION RESPONSE; SINGLE EVENT EFFECTS; SINGLE EVENT TRANSIENT; SINGLE EVENT UPSET;

CMOS INTEGRATED CIRCUITS;

EID: 11044239423     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839172     Document Type: Conference Paper

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