Scaling and soft errors: Moore of the same for SOI?

Proceedings - IEEE International SOI Conference

Volumn , Issue , 2008, Pages 129-130

  Alles, M L ^a   Ball, D R ^a   Massengill, L W ^a   Schrimpf, R D ^a   Reed, R A ^a   Bhuva, B L ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 57749198247     PISSN: 1078621X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOI.2008.4656328     Document Type: Conference Paper

References (6)

1. D. F. Heidel et al., IEEE Trans. Nucl. Sci. 53, 3512 (2006).
2. M. L. Alles et al., in Selected Topics in Electronics and Systems, IJHSES, ed. S. Cristoloveanu and M. Shur, in press.
3. O. A. Amusan et al., IEEE Trans. Nucl. Sci. 53, 3253 (2006).
4. B. D. Olson et al., IEEE Trans. Nucl. Sci. 52, 2132 (2005).
5. M. L. Alles et al., IEEE Int. SOI Conf. Proc., 191 (2005).
6. S. Ohkonin, et al., IEEE Int. SOI Conf. Proc., 153 (2001).