Total-ionizing-dose radiation response of partially-depleted SOI devices

Proceedings - IEEE International SOI Conference

Volumn , Issue , 2010, Pages

  Rezzak, Nadia ^a   Zhang, En Xia ^a   Alles, Michael L ^a   Schrimpf, Ronald D ^a   Hughes, Harold ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACK CHANNELS; BODY DOPING; PARTIALLY DEPLETED; RADIATION RESPONSE; SOI DEVICES; SUB-100 NM;

EID: 78650553278     PISSN: 1078621X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOI.2010.5641057     Document Type: Conference Paper

References (4)

1. Hon-sum P. Wong et al, TNS, April. 1999
2. Mukesh Khare et al, TNS, 2002
3. J. F. Conley et al, TNS, Dec. 1997
4. B. J. Mrstik et al, TNS, Dec. 2001