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Volumn 49, Issue 4, 2002, Pages 658-664

Status and prospects for SiC power MOSFETs

Author keywords

Metal oxide semiconductor field effect transistors (MOSFETs); Power devices; Silicon carbide

Indexed keywords

POWER DEVICES;

EID: 0036539101     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.992876     Document Type: Article
Times cited : (459)

References (40)
  • 4
    • 21544441547 scopus 로고
    • Characterization of device parameters in high-temperature metal-oxide-semiconductor field-effect transistors in β-SiC thin films
    • (1988) J. Appl. Phys. , vol.64 , pp. 2168
  • 22
    • 0039731169 scopus 로고    scopus 로고
    • Aluminum and boron ion implantations into 6H-SiC epilayers
    • (1996) J. Electron. Mater. , vol.25 , pp. 879


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.