X-Ray diffraction as a local probe tool

ChemPhysChem

Volumn 10, Issue 17, 2009, Pages 2923-2930

  Stangl, J ^a   Mocuta, C ^b,c   Diaz, A ^a,b   Metzger, T H ^b   Bauer, G ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c SYNCHROTRON SOLEIL   (France)

Author keywords

Nanostructures; Nanowires; Structure elucidation; Surface analysis; X ray diffraction

Indexed keywords

CHEMICAL ANALYSIS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LUNAR SURFACE ANALYSIS; NANOSTRUCTURES; NANOWIRES; PROBES; SCANNING ELECTRON MICROSCOPY; STRAIN; SURFACE ANALYSIS;

CHEMICAL COMPOSITIONS; DIFFERENT ANALYSIS TECHNIQUES; NANO-SCALE OBJECTS; STRAIN DISTRIBUTIONS; STRUCTURAL CHARACTERIZATION; STRUCTURE ELUCIDATION; SYNCHROTRON SOURCE; X-RAY DIFFRACTION STUDIES;

X RAY DIFFRACTION;

EID: 73349134348     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.200900563     Document Type: Review

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