Simultaneous microRaman and synchrotron radiation microdiffraction: Tools for materials characterization

Applied Physics Letters

Volumn 87, Issue 26, 2005, Pages 1-3

  Davies, R J ^a   Burghammer, M ^a   Riekel, C ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAM EFFECTS; RAMAN SCATTERING; SILICON; TANTALUM; X RAY DIFFRACTION ANALYSIS;

RAMAN BAND; X-RAY BEAMS; X-RAY MICRODIFFRACTION;

SYNCHROTRON RADIATION;

EID: 29744454533     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2159087     Document Type: Article

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