Local structure of a rolled-up single crystal: An X-ray microdiffraction study of individual semiconductor nanotubes

Physical Review Letters

Volumn 96, Issue 16, 2006, Pages

  Krause, B ^a,b   Mocuta, C ^a,b   Metzger, T H ^a,b   Deneke, Ch ^b   Schmidt, O G ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; LATTICE CONSTANTS; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION ANALYSIS;

BILAYERS; CYLINDRICAL SYMMETRY; LATTICE PARAMETER DISTRIBUTIONS; X-RAY MICROBEAM DIFFRACTION;

SINGLE CRYSTALS;

EID: 33646371261     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.165502     Document Type: Article

References (19)

1. V.Y. Prinz, V.A. Seleznev, A.K. Gutakovsky, A.V. Chekhovskiy, V.V. Preobrazhenskii, M.A. Puyato, and T.A. Gavrilova, Physica (Amsterdam) 6E, 828 (2000). PELNFM 1386-9477 10.1016/S1386-9477(99)00249-0
2. O.G. Schmidt and K. Eberl, Nature (London) NATUAS 0028-0836 410, 168 (2001). 10.1038/35065525
3. C. Deneke and O.G. Schmidt, Appl. Phys. Lett. 85, 2914 (2004). APPLAB 0003-6951 10.1063/1.1795973
4. O.G. Schmidt, C. Deneke, S. Kiravittaya, R. Songmuang, H. Heidemeyer, Y. Nakamura, R. Zapf-Gottwick, C. Müller, and N.Y. Jin-Phillipp, IEEE J. Sel. Top. Quantum Electron. 8, 1025 (2002). IJSQEN 1077-260X 10.1109/JSTQE.2002. 804235
5. S. Mendach, R. Songmuang, S. Kiravittaya, A. Rastelli, M. Benjoucef, and O.G. Schmidt, Appl. Phys. Lett. 88, 111120 (2006). APPLAB 0003-6951 10.1063/1.2186509
6. C. Deneke, C. Müller, N.-Y. Jin-Phillipp, and O.G. Schmidt, Semicond. Sci. Technol. 17, 1278 (2002). SSTEET 0268-1242 10.1088/0268-1242/17/ 12/312
7. M.H. Huang, C. Boone, M. Roberts, D.E. Savage, M.G. Lagally, N. Shaji, H. Qin, R. Blick, J.A. Nairn, and F. Liu, Adv. Mater. ADVMEW 0935-9648 17, 2860 (2005). 10.1002/adma.200501353
8. O.G. Schmidt, N. Schmarje, C. Deneke, C. Müller, and N.Y. Jin-Phillipp, Adv. Mater. ADVMEW 0935-9648 13, 756 (2001). 10.1002/1521- 4095(200105)13:10<756::AID-ADMA756>3.0.CO;2-F
9. O. Schumacher, S. Mendach, H. Welsch, A. Schramm, C. Heyn, and W. Hansen, Appl. Phys. Lett. 86, 143109 (2005). APPLAB 0003-6951 10.1063/1.1897056
10. V. Luchnikov, O. Sydorenko, and M. Stamm, Adv. Mater. ADVMEW 0935-9648 17, 1177 (2005). 10.1002/adma.200401836
11. Y.V. Nastaushev, V.Y. Prinz, and S.N. Svitasheva, Nanotechnology 16, 908 (2005). NNOTER 0957-4484 10.1088/0957-4484/16/6/047
12. C. Deneke, N.-Y. Jin-Phillipp, I. Loa, and O.G. Schmidt, Appl. Phys. Lett. 84, 4475 (2004). APPLAB 0003-6951 10.1063/1.1755835
13. U. Pietsch, V. Holý, and T. Baumbach, High-Resolution X-Ray Scattering from Thin Films and Lateral Nanostructures (Springer-Verlag, Berlin Heidelberg, 2004).
14. J.D. Budai, W. Yang, N. Tamura, J.-S. Chung, J.Z. Tischler, B.C. Larson, G.E. Ice, C. Park, and C.P. Norton, Nat. Mater. 2, 487 (2003). 1476-1122 10.1038/nmat916
15. D. Loidl, O. Paris, M. Burghammer, C. Riekel, and H. Peterlik, Phys. Rev. Lett. 95, 225501 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.225501
16. R. Songmuang, N.-Y. Jin-Phillipp, S. Mendach, and O.G. Schmidt, Appl. Phys. Lett. 88, 021913 (2006). APPLAB 0003-6951 10.1063/1.2159414
17. N.-Y. Jin-Phillipp, J. Thomas, M. Kelsch, C. Deneke, R. Songmuang, and O.G. Schmidt, Appl. Phys. Lett. 88, 033113 (2006). APPLAB 0003-6951 10.1063/1.2164913
18. V.Y. Prinz, A.V. Chekhovskiy, V.V. Preobrazhenskii, B.R. Semyagin, and A.K. Gutakovsky, Nanotechnology 13, 231 (2002). NNOTER 0957-4484 10.1088/0957-4484/13/2/319
19. M. Grundmann, Appl. Phys. Lett. 83, 2444 (2003). APPLAB 0003-6951 10.1063/1.1613366