Non-destructive determination of strain 100-nanometre spatial resolution

Nature

Volumn 403, Issue 6770, 2000, Pages 638-640

  Di Fonzo, S ^a   Jark, W ^a   Lagomarsino, S ^b   Giannini, C ^c   De Caro, L ^c   Cedola, A ^b,d   Muller M ^d  

^a SINCROTRONE TRIESTE   (Italy)

^b CNR   (Italy)

^c Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali   (Italy)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

NANOPARTICLE; SILICON;

ARTICLE; CHEMICAL STRUCTURE; COLLIMATOR; ELECTRON DIFFRACTION; OPTICAL RESOLUTION; PRIORITY JOURNAL; RAMAN SPECTROMETRY; X RAY DIFFRACTION;

EID: 0034628505     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/35001035     Document Type: Article

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