Focusing x-ray beams to nanometer dimensions

Physical Review Letters

Volumn 91, Issue 20, 2003, Pages

  Bergemann, C ^a   Keymeulen, H ^b   van der Veen, J F ^b  

^a ETH ZURICH   (Switzerland)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; EIGENVALUES AND EIGENFUNCTIONS; ELECTRONIC DENSITY OF STATES; FOCUSING; LAPLACE TRANSFORMS; LIGHT INTERFERENCE; NANOTECHNOLOGY; NONLINEAR EQUATIONS; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; OPTICAL WAVEGUIDES; QUANTUM OPTICS;

DIFFRACTION PATTERNS; FOCUSING X RAY BEAMS; HANKEL FUNCTION; MODE MIXING; NANOMETER DIMENSIONS; QUANTUM WAVE FUNCTION;

X RAY OPTICS;

EID: 0347477218     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.91.204801     Document Type: Article

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