Coherent diffraction tomography of nanoislands from grazing-incidence small-angle x-ray scattering

Applied Physics Letters

Volumn 94, Issue 12, 2009, Pages

  Yefanov, O M ^a   Zozulya, A V ^a   Vartanyants, I A ^a   Stangl, J ^b   Mocuta, C ^c,e   Metzger, T H ^c   Bauer, G ^b   Boeck, T ^d   Schmidbauer, M ^d  

^a DESY   (Germany)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

^e SYNCHROTRON SOLEIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DIAGNOSTIC RADIOGRAPHY; ELECTRON DENSITY MEASUREMENT; ELECTRONS; RESTORATION; SCATTERING; SEMICONDUCTING SILICON COMPOUNDS; TOMOGRAPHY; X RAY SCATTERING;

COHERENT DIFFRACTIONS; ELECTRON DENSITIES; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERINGS; INTENSITY DISTRIBUTIONS; NANO-ISLANDS; PHASE RETRIEVALS; RECIPROCAL SPACES; SIGE ISLANDS; SPATIAL RESOLUTIONS; THREE-DIMENSIONAL (3D); TOMOGRAPHIC; TOMOGRAPHIC METHODS; TRUNCATED PYRAMIDS;

THREE DIMENSIONAL;

EID: 63549086329     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3103246     Document Type: Article

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