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Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 936-943

Submicron X-ray diffraction

(10) MacDowell, A A a Celestre, R S a Tamura, N a Spolenak, R b Valek, B c Brown, W L b Bravman, J C c Padmore, H A a Batterman, B W a Patel, J R a,d

a LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

b LUCENT TECHNOLOGIES (United States)

c Stanford University (United States)

d SLAC NATIONAL ACCELERATOR LABORATORY (United States)

Author keywords

Electromigration; X ray focusing; X ray micro diffraction

Indexed keywords

EID: 0000904358 PISSN: 01689002 EISSN: None Source Type: Journal
DOI: 10.1016/S0168-9002(01)00530-7 Document Type: Article

Times cited : (109)

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